Description: Implementation DFT structure, including Tessent EDT scan chains, Memory BIST and Logic BIST to ensure high test coverage and low test time Generate Scan and MBIST test patterns using ATPG tools Collaborate with the design team to ensure  ...         
        
                16 days ago            
            
        
             Description: Implementation DFT structure, including Tessent EDT scan chains, Memory BIST and Logic BIST to ensure high test coverage and low test time Generate Scan and MBIST test patterns using ATPG tools Collaborate with the design team to ensure  ...         
        
                17 days ago